• DocumentCode
    472630
  • Title

    Gate Oxide Thinning Limit Influenced by Gate Materials

  • Author

    Itsumi, Manabu ; Muramoto, Susumu

  • Author_Institution
    Atsugi Electrical Communication Laboratory, NTT Atsugi-shi, Kanagawa, 243-01, Japan
  • fYear
    1985
  • fDate
    14-16 May 1985
  • Firstpage
    22
  • Lastpage
    23
  • Abstract
    N-type poly Si has no serious influence on thin oxides down to about 30 Ã…. For a boron-doped poly-Si gate, however, current increase characterized by negative gate bias is found. For an Mo gate, gate oxide surface layer of about 20 Ã… next to the gate are deteriorated. By minimizing boron diffusion from a boron-doped poly-Si and Mo penetration during Mo gate formation, both gates will be of practical use for thin gate oxide down to near 30 Ã….
  • Keywords
    Annealing; Boron; CMOS technology; Electrodes; Electrons; MOS capacitors; Silicon; Thickness measurement; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1985. Digest of Technical Papers. Symposium on
  • Conference_Location
    Kobe, Japan
  • Print_ISBN
    4-930813-09-3
  • Type

    conf

  • Filename
    4480284