DocumentCode
472675
Title
Submicron MLDO NMOSFETs for 5V Operation
Author
Kinugawa, Masaaki ; Kakumu, Masakazu ; Yokogawa, Shunji ; Hashimoto, Kazuhiko
Author_Institution
Semiconductor Device Engineering Laboratory Toshiba Corporation; Kawasaki Japan
fYear
1985
fDate
14-16 May 1985
Firstpage
116
Lastpage
117
Keywords
Degradation; Design engineering; Hot carriers; MOSFET circuits; Power engineering and energy; Power supplies; Semiconductor devices; Stress; Substrate hot electron injection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1985. Digest of Technical Papers. Symposium on
Conference_Location
Kobe, Japan
Print_ISBN
4-930813-09-3
Type
conf
Filename
4480331
Link To Document