• DocumentCode
    472687
  • Title

    Scaling CMOS Technologies with Constant Latch-Up Immunity

  • Author

    Lewis, Alan G. ; Martin, Russel A. ; Huang, Tiao Y. ; Chen, John Y. ; Bruce, Richard H.

  • Author_Institution
    Xerox, Palo Alto Research Center, 3333, Coyote Hill Road, Palo Alto, CA 94304
  • fYear
    1986
  • fDate
    28-30 May 1986
  • Firstpage
    23
  • Lastpage
    24
  • Keywords
    Bipolar transistors; CMOS technology; Circuits; Critical current; Doping; Epitaxial layers; Geometry; Substrates; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1986. Digest of Technical Papers. Symposium on
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • Filename
    4480351
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472687