DocumentCode
472709
Title
Asymmetry of the Substrate Current Characteristics Enhanced by the Gate Bird´s Beak
Author
Hamamoto, T. ; Oowaki, Y. ; Hieda, K. ; Ohuchi, K.
Author_Institution
VLSI Research Center Toshiba Corporation 1, Komukai, Toshibacho, Saiwaiku, Kawasaki 210, Japan
fYear
1986
fDate
28-30 May 1986
Firstpage
67
Lastpage
68
Keywords
Analytical models; Degradation; Electric resistance; Impact ionization; Ion beams; MOSFET circuits; Probability distribution; Shadow mapping; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1986. Digest of Technical Papers. Symposium on
Conference_Location
San Diego, CA, USA
Type
conf
Filename
4480373
Link To Document