DocumentCode

472744

Title

Hot-Carrier Effects under Pulsed Stress in CMOS Devices

Author

Aoki, Masaaki ; Yano, Kazuo ; Masuhara, Toshiaki ; Komiyaji, Kunihiro

Author_Institution

Central Research Laboratory, Hitachi Ltd. Kokubunji, Tokyo 185, Japan

fYear

1987

fDate

22-23 May 1987

Firstpage

49

Lastpage

50

Keywords

Degradation; Doping; Electron traps; Filling; Hot carrier effects; Hot carriers; MOSFETs; Predictive models; Pulse generation; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1987. Digest of Technical Papers. Symposium on

Conference_Location

Karuizawa, Japan

Type

conf

Filename

4480416