• DocumentCode
    472790
  • Title

    Bipolar Technologies for High Speed VLSIs

  • Author

    Nakamura, Hiroaki ; Sakai, Tetsushi

  • Author_Institution
    Musashino Electrical Communication Laboratory 3-9-11, Midoricho, Musashinoshi, Tokyo, 180 Japan
  • fYear
    1981
  • fDate
    9-11 Sept. 1981
  • Firstpage
    36
  • Lastpage
    37
  • Keywords
    Delay effects; Doping profiles; Electrodes; Fabrication; Frequency; Impurities; Parasitic capacitance; Stability; Temperature; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 1981. Digest of Technical Papers. Symposium on
  • Conference_Location
    Maui, HI, USA
  • Type

    conf

  • Filename
    4480513
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=472790