DocumentCode :
472825
Title :
"A 2μm Silicide Gate CMOS Processing for High Performance RAM Circuitries"
Author :
Yasuda, H. ; Hashimoto, K. ; Nozawa, H. ; Ochii, K. ; Kohyama, S.
Author_Institution :
Semiconductor Division, Toshiba Corp Saiwaiku, Kawasaki, 210, Japan
fYear :
1982
fDate :
1-3 Sept. 1982
Firstpage :
14
Lastpage :
15
Abstract :
With the increase of capacity in semiconductor memories, demands for higher speed and higher density CMOS RAMs have also been growing rapidly, still requiring to maintain their inherent low power advantages. In order to meet the demands I it is necessary to achieve an ingenious combination of advanced process and circuit technologies. In this paper, a hiah speed and low power circuit based on an internally synchronous system, a 2μm silicide gate CMOS process, and their optimized combination as a 16K bit RAM is described.
Keywords :
CMOS memory circuits; CMOS process; CMOS technology; Conductivity; Geometry; MOS devices; Pulse amplifiers; Semiconductor memory; Silicides; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location :
Oiso, Japan
Type :
conf
Filename :
4480556
Link To Document :
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