Title :
Statistical Modeling for Large Scale Integrated Circuit Design
Author :
Inohira, S. ; Shinmi, T. ; Nagata, M. ; Iida, K.
Author_Institution :
Hitachi Central Research Laboratory Kokubunji, Tokyo 185, Japan
Keywords :
Circuit optimization; Circuit simulation; Circuit synthesis; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit synthesis; Large scale integration; Production; Very large scale integration; Voltage;
Conference_Titel :
VLSI Technology, 1982. Digest of Technical Papers. Symposium on
Conference_Location :
Oiso, Japan
