• DocumentCode
    47292
  • Title

    Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks

  • Author

    Sievers, S. ; Liebing, N. ; Serrano-Guisan, S. ; Ferreira, R. ; Paz, E. ; Caprile, A. ; Manzin, A. ; Pasquale, M. ; Skowronski, W. ; Stobiecki, T. ; Rott, K. ; Reiss, G. ; Langer, J. ; Ocker, B. ; Schumacher, H.W.

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Braunschweig, Germany
  • Volume
    51
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We explore the prospects of wafer-scale inductive probing of the critical current density jc0 for spin-transfer torque (STT) switching of CoFeB/MgO/CoFeB magnetic tunnel junctions with varying MgO thickness. From inductive measurements, magnetostatic parameters and effective damping are derived and jc0 is calculated based on STT equations. The inductive values compare well with the values derived from current-induced switching measurements on individual nanopillars. Using a wafer-scale inductive probe head could enable wafer probe station-based metrology of jc0 in the future.
  • Keywords
    boron alloys; cobalt alloys; critical currents; damping; iron alloys; magnesium compounds; magnetic switching; magnetic tunnelling; magnetisation reversal; CoFeB-MgO-CoFeB; STT equations; critical current density; current-induced switching measurements; damping; inductive measurements; magnetic tunnel junction stacks; magnetostatic parameters; spin-transfer torque critical current density; spin-transfer torque switching; wafer probe station-based metrology; wafer scale inductive characterization; wafer-scale inductive probe head; wafer-scale inductive probing; Damping; Magnetic resonance; Magnetic tunneling; Magnetization; Magnetomechanical effects; Magnetostatics; Materials; Critical current density; magnetic random access memory (MRAM); spin-transfer torque (STT);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2014.2357808
  • Filename
    7029231