Title :
Small Geometry MOS Transistor Measurements and Observed Short and Narrow Channel Effects
Author :
Iwai, H. ; Oristian, J. ; Walker, J. ; Dutton, R.
Author_Institution :
Integrated Circuits Laboratory, Stanford University Stanford, California 94305
Keywords :
Capacitance measurement; Circuit testing; Computational geometry; Integrated circuit measurements; Laboratories; MOSFETs; Parasitic capacitance; Pulse amplifiers; Pulse measurements; Voltage;
Conference_Titel :
VLSI Technology, 1984. Digest of Technical Papers. Symposium on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
4-930813-08-5
