DocumentCode
473572
Title
Classification of strokes and identification of stroke location from the measured tower base currents of LPS to Indian satellite launch pad-I
Author
Hegde, Vishwanath ; Kumar, Udaya
Author_Institution
Dept. of Electr. Eng., Malnad Coll. of Eng. Hassan, Hassan
fYear
2007
fDate
3-6 Dec. 2007
Firstpage
1161
Lastpage
1166
Abstract
Performance of any engineering design needs to be evaluated in the field, irrespective of its sophistication. This is specifically true for lightning protection systems. Even though there are many options for this, several considerations show that the measurement of lightning currents at the tower bases is an ideal choice. Once such measurements are done, two basic issues need to be addressed. First one is the classification of strokes due to intercepted strokes, bypass strokes and stroke to ground outside the protected volume of the Lightning Protection System (LPS). Second one is the identification of stroke location from the measured tower base current. These issues have been addressed in the present work. A suitable electromagnetic model is proposed and an experimental validation has been provided for the numerical modelling. Basic characteristics of tower base currents for different strokes have been identified and based on the same a simple procedure is developed for classification of strokes and identification of stroke location. These contributions are quite novel and seems to be first of their kind.
Keywords
electric current measurement; fault currents; lightning protection; poles and towers; Indian Satellite Launch Pad-I; electromagnetic model; lightning currents measurement; lightning protection systems; stroke location identification; strokes classification; tower base currents; Current measurement; Poles and towers; Power engineering; Satellites; Incident Stroke current; Lightning; Lightning Protection System; Stroke Classification; Tower Base currents;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Conference, 2007. IPEC 2007. International
Conference_Location
Singapore
Print_ISBN
978-981-05-9423-7
Type
conf
Filename
4510201
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