• DocumentCode
    473897
  • Title

    Infrared nanoscopy

  • Author

    Keilmann, Fritz

  • Author_Institution
    Max-Planck-Inst. fur Biochem., Martinsried
  • fYear
    2007
  • fDate
    2-9 Sept. 2007
  • Firstpage
    26
  • Lastpage
    30
  • Abstract
    My contribution is to highlight a recent advance in the area of microscopy: infrared near-field microscopy of the scattering type (infrared s-SNOM). This ultra-resolving infrared microscopy has come quite as a surprise because the >3 mum wavelengths seemed to prohibit - from Abbe´s rule - any sub-micrometer resolution. The realization of a 10-nm resolving infrared microscope enables the power of infrared spectroscopy to benefit future nanoscience research.
  • Keywords
    infrared spectroscopy; optical microscopy; Abbe rule-any submicrometer resolution; infrared nanoscopy; infrared near-field microscopy; nanoscience research; scattering type; ultraresolving infrared microscopy; Atom optics; Atomic force microscopy; Electron optics; Infrared spectra; Light scattering; Optical microscopy; Optical scattering; Optical surface waves; Particle scattering; Scanning electron microscopy; THz microscopy; infrared frequency combs; infrared microscopy; near-field microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
  • Conference_Location
    Cardiff
  • Print_ISBN
    978-1-4244-1438-3
  • Type

    conf

  • DOI
    10.1109/ICIMW.2007.4516382
  • Filename
    4516382