• DocumentCode
    474084
  • Title

    Chaotic electron dynamics in a semiconductor superlattice

  • Author

    Moghadam, Fatemeh ; Esmaeilzadeh, M.

  • Author_Institution
    Shahid Beheshti Univ., Tehran
  • fYear
    2007
  • fDate
    2-9 Sept. 2007
  • Firstpage
    528
  • Lastpage
    529
  • Abstract
    A theory for electron dynamics in a semiconductor superlattice in the presence of external electric and magnetic fields is presented. A semiclassical non-linear equation of motion for a single electron in the combined external electric and magnetic fields and self-field induced by current density of electrons is then derived. The elastic and inelastic (dissipative) electron scatterings are taken into account. A fourth-order Runge-Kutta method with adaptive step size is used to integrate non-linear equation of motion. To determine chaotic electron motion in a semiconductor superlattice Liapunov exponents are calculated. It is shown that for external magnetic field perpendicular to the external electric field the electron motion becomes non-chaotic and regular.
  • Keywords
    Lyapunov methods; Runge-Kutta methods; chaos; current density; electric fields; electron collisions; magnetic fields; nonlinear equations; semiconductor superlattices; Liapunov exponents; Runge-Kutta method; chaotic electron dynamics; chaotic electron motion; current density; external electric fields; external magnetic fields; inelastic electron scattering; nonlinear equation of motion; semiconductor superlattice; Chaos; Electric fields; Electrons; Frequency; Magnetic fields; Magnetic superlattices; Molecular beam epitaxial growth; Nonlinear equations; Scattering; Semiconductor superlattices; Chaos; Liapunov exponents; electron dynamics; semiconductor superlattice;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
  • Conference_Location
    Cardiff
  • Print_ISBN
    978-1-4244-1438-3
  • Type

    conf

  • DOI
    10.1109/ICIMW.2007.4516615
  • Filename
    4516615