DocumentCode
474191
Title
Loss mechanisms for T-ray microwires
Author
Atakaramians, Shaghik ; Vahid, Shahraam ; Fischer, Bernd M. ; Abbott, Derek ; Monro, Tanya M.
Author_Institution
Sch. of Electr. & Electron. Eng., Univ. of Adelaide, Adelaide, SA
fYear
2007
fDate
2-9 Sept. 2007
Firstpage
811
Lastpage
812
Abstract
In this paper we will present predictions for loss mechanisms caused by material, waveguide, surface roughness and bends in microwires and estimate their affect on the total loss in the terahertz regime.
Keywords
losses; submillimetre waves; surface roughness; waveguides; wires (electric); T-ray microwires; THz region; bend loss; loss mechanisms; material losses; surface roughness; terahertz region; waveguide losses; Dielectric loss measurement; Electromagnetic waveguides; Hollow waveguides; Optical fiber losses; Optical losses; Optical materials; Optical waveguides; Propagation losses; Rectangular waveguides; Waveguide discontinuities;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location
Cardiff
Print_ISBN
978-1-4244-1438-3
Type
conf
DOI
10.1109/ICIMW.2007.4516743
Filename
4516743
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