Title :
THz tomographic imaging by using two-dimensional electro-optic sampling
Author :
Kitahara, Hideaki ; Enatsu, Tokujiro ; Tani, Masahiko ; Hangyo, Masanori
Author_Institution :
Inst. of Laser Eng., Osaka Univ., Suita
Abstract :
A tomographic imaging system has constructed based on the two-dimensional electro-optic sampling in the reflection scheme. The imaging system is able to make a two-dimensional depth scan for an area of 30 mm times 24 mm with a 7-mm depth. Tomographic images obtained with this imaging system reveal the inner-structures of test samples, such as the stacked high-resistivity silicon plates, successfully.
Keywords :
electro-optical devices; submillimetre wave imaging; THz tomographic imaging; reflection scheme; stacked high-resistivity silicon plates; two-dimensional electro-optic sampling; High-resolution imaging; Image sampling; Lenses; Optical imaging; Optical reflection; Optical surface waves; Sampling methods; Silicon; System testing; Tomography;
Conference_Titel :
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-1-4244-1438-3
DOI :
10.1109/ICIMW.2007.4516788
