• DocumentCode
    47430
  • Title

    Effect of surface conditions on the electric field in air cavities

  • Author

    Levesque, Martin ; David, E. ; Hudon, C.

  • Author_Institution
    Ecole de Technol. Super., Montreal, QC, Canada
  • Volume
    20
  • Issue
    1
  • fYear
    2013
  • fDate
    Feb-13
  • Firstpage
    71
  • Lastpage
    81
  • Abstract
    A numerical PD model was developed to obtain more insight into the understanding of the evolution of slot Partial Discharge (PD) activity. This model, in which multiple PD channels were simultaneously active, was used to evaluate the influence of the surface condition on the electric field distribution inside an air cavity typical of the one where slot PDs occur. It was observed that the insulation degradation induced by slot PD activity increases its surface conductivity, which in turn modifies the dynamic of the surface charges deposited by previous PDs and directly affects the electric field and the slot PD behavior itself. The experimental results of surface conductivity measurements and observations of physical changes in surface conditions obtained from previous laboratory experiments were used to feed the PD model. This paper reports the result of the electric field calculation in the presence of PD activity under different surface conditions.
  • Keywords
    electric fields; numerical analysis; partial discharges; surface charging; surface conductivity; PD activity; air cavity; electric field; electric field distribution; insulation degradation; multiple PD channels; numerical PD model; slot partial discharge activity; surface charges; surface condition effect; surface conductivity measurements; Atmospheric modeling; Cavity resonators; Electric fields; Insulation; Mathematical model; Partial discharges; Surface treatment; Slot partial discharges; electric field calculation; insulation; modeling; surface degradation;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2013.6451343
  • Filename
    6451343