• DocumentCode
    474456
  • Title

    Functional test selection based on unsupervised support vector analysis

  • Author

    Guzey, Onur ; Wang, Li.-C. ; Levitt, Jeremy ; Foster, Harry

  • Author_Institution
    Univ. of CA, Santa Barbara, CA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    262
  • Lastpage
    267
  • Abstract
    Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverage metrics are essential to guide the development of effective test suites. Traditional coverage metrics are defined based on either a functional model or a structural model of the design. If our goal is to select a subset of tests from a set of tests, using these coverage metrics require simulation of the entire set before the effectiveness of tests can be compared. In this paper, we propose a novel methodology that estimates the input space covered by a set of tests. We use unsupervised support vector analysis to learn such a space, resulting in a subset of tests that represent the original set of tests. A direct application of this methodology is to select tests before simulation in order to reduce simulation cycles. Consequently, simulation effectiveness can be improved. Experimental results based on application of the proposed methodology to the OpenSparc Tl processor are reported to demonstrate the practicality of our approach.
  • Keywords
    circuit simulation; integrated circuit testing; logic CAD; support vector machines; unsupervised learning; OpenSparc Tl processor; functional design verification; functional test selection; logic design; software-based simulation; unsupervised support vector analysis; Algorithm design and analysis; Functional analysis; Graphics; Hardware; Logic design; Logic testing; Permission; Random number generation; Time to market; Writing; Functional verification; Learning; Support Vector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555820