Title :
Circuit and microarchitecture evaluation of 3D stacking magnetic RAM (MRAM) as a universal memory replacement
Author :
Dong, Xiangyu ; Wu, Xiaoxia ; Sun, Guangyu ; Xie, Yuan ; Li, Helen ; Chen, Yiran
Author_Institution :
Pennsylvania State Univ., University Park, PA
Abstract :
Magnetic random access memory (MRAM) has been considered as a promising memory technology due to many attractive properties. Integrating MRAM with CMOS logic may incur extra manufacture cost, due to its hybrid magnetic-CMOS fabrication process. Stacking MRAM on top of CMOS logics using 3D integration is a way to minimize this cost overhead. In this paper, we discuss the circuit design issues for MRAM, and present the MRAM cache model. Based on the model, we compare MRAM against SRAM and DRAM in terms of area, performance, and energy. Finally we conduct architectural evaluation for 3D microprocessor stacking with MRAM. The experimental results show that MRAM stacking offers competitive IPC performance with a large reduction in power consumption compared to SRAM and DRAM counterparts.
Keywords :
CMOS logic circuits; magnetic storage; microcomputers; random-access storage; 3D stacking magnetic RAM; CMOS logic; DRAM; IPC performance; MRAM; SRAM; microarchitecture evaluation; microprocessor stacking; power consumption; universal memory replacement; CMOS logic circuits; CMOS technology; Costs; Magnetic circuits; Magnetic properties; Microarchitecture; Random access memory; Read-write memory; Semiconductor device modeling; Stacking; 3D Stacking; MRAM;
Conference_Titel :
Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-60558-115-6