• DocumentCode
    474512
  • Title

    Circuit and microarchitecture evaluation of 3D stacking magnetic RAM (MRAM) as a universal memory replacement

  • Author

    Dong, Xiangyu ; Wu, Xiaoxia ; Sun, Guangyu ; Xie, Yuan ; Li, Helen ; Chen, Yiran

  • Author_Institution
    Pennsylvania State Univ., University Park, PA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    554
  • Lastpage
    559
  • Abstract
    Magnetic random access memory (MRAM) has been considered as a promising memory technology due to many attractive properties. Integrating MRAM with CMOS logic may incur extra manufacture cost, due to its hybrid magnetic-CMOS fabrication process. Stacking MRAM on top of CMOS logics using 3D integration is a way to minimize this cost overhead. In this paper, we discuss the circuit design issues for MRAM, and present the MRAM cache model. Based on the model, we compare MRAM against SRAM and DRAM in terms of area, performance, and energy. Finally we conduct architectural evaluation for 3D microprocessor stacking with MRAM. The experimental results show that MRAM stacking offers competitive IPC performance with a large reduction in power consumption compared to SRAM and DRAM counterparts.
  • Keywords
    CMOS logic circuits; magnetic storage; microcomputers; random-access storage; 3D stacking magnetic RAM; CMOS logic; DRAM; IPC performance; MRAM; SRAM; microarchitecture evaluation; microprocessor stacking; power consumption; universal memory replacement; CMOS logic circuits; CMOS technology; Costs; Magnetic circuits; Magnetic properties; Microarchitecture; Random access memory; Read-write memory; Semiconductor device modeling; Stacking; 3D Stacking; MRAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555878