Title :
Subwavelength imaging via dark state
Author :
Li, Hebil ; Sautenkov, Vladimir ; Kash, Michael ; Welch, George R. ; Rostovtsev, Yuri V. ; Scully, Marlan O.
Author_Institution :
Dept. of Phys., Texas A&M Univ., College Station, TX
Abstract :
We theoretically study possibilities of creating spatial patterns having subwavelength length by using so-called dark states. These dark states are formed via interaction with bichromatic optical fields. Performing experiments in Rb vapor, we experimentally demonstrated spatial patterns that are smaller than the length determined by the diffraction limit of optical system used in the experiment. This approach has applications to interference lithography and can be used in coherent Raman spectroscopy to reach subwavelength spatial resolution.
Keywords :
Raman spectroscopy; dark states; image resolution; light interferometry; molecule-photon collisions; optical images; optical information processing; optical microscopy; photolithography; quantum optics; rubidium; Rb; bichromatic optical field interaction; coherent Raman spectroscopy; dark states; diffraction limitation; interference lithography; rubidium vapor; spatial pattern creation; subwavelength imaging; subwavelength spatial resolution; Atom optics; Biomedical optical imaging; Dark states; Drives; Interference; Nonlinear optics; Optical microscopy; Optical mixing; Optical scattering; Probes; (190.4380) Nonlinear optics, four-wave mixing; (300.6290) Spectroscopy, four-wave mixing;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9