• DocumentCode
    475156
  • Title

    Response characteristics test of ultra-fast optical devices with optical spectrogram scope (OSS)

  • Author

    Konishi, Tsuyoshi ; Goto, Hiroomi

  • Author_Institution
    Grad. Sch. of Eng., Osaka Univ., Suita
  • Volume
    1
  • fYear
    2008
  • fDate
    22-26 June 2008
  • Firstpage
    81
  • Lastpage
    83
  • Abstract
    In this paper, we review and introduce the optical spectrogram scope (OSS) as a powerful measurement instrument for response characteristic test of ultra-fast all-optical devices and sub-systems in photonic networks. In general, most of optical signals in photonic networks are basically composed of time and frequency resources. Since ultra-fast optical devices generate, receive, and cut through these signals, their response characteristics in time-frequency domain would provide for very useful information for device qualities. Our time-frequency map monitor; OSS can visualize a time-frequency status of an ultra-fast optical signal in a birdpsilas-eye view. In addition, various time and frequency resolution data can be observed with controlling them in at least video rate. We apply OSS to optical signals from optical encoders and visualize its time-frequency status in a birdpsilas-eye view to demonstrate its usefulness for response characteristics test of ultra-fast optical devices including passive devices.
  • Keywords
    high-speed optical techniques; optical communication equipment; optical testing; optical encoders; optical spectrogram scope; response characteristics test; ultrafast optical signal; Character generation; Data visualization; Instruments; Monitoring; Optical devices; Optical fiber networks; Signal generators; Spectrogram; Testing; Time frequency analysis; all-optical devices and sub-systems; device under test; optical measurement instrument; optical signal evaluation; time-frequency map;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transparent Optical Networks, 2008. ICTON 2008. 10th Anniversary International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-2625-6
  • Electronic_ISBN
    978-1-4244-2626-3
  • Type

    conf

  • DOI
    10.1109/ICTON.2008.4598376
  • Filename
    4598376