• DocumentCode
    475301
  • Title

    The impact of top management team conflict on new product development: The case of Taiwan and the United States

  • Author

    Hsieh, Tsun-Jui ; Chung, Hsien-Jui

  • Author_Institution
    Dept. of Int. Bus., Asia Univ., Taichung
  • fYear
    2008
  • fDate
    27-31 July 2008
  • Firstpage
    1206
  • Lastpage
    1213
  • Abstract
    This study demonstrates how top management team (TMT) conflict impacts new product development (NPD) under cultural differences between Taiwan and the United States. Based on cultural differences, we compare Taiwan and the United States to explore how the heterogeneity of TMT composition leads to team conflict and how TMT conflict affects NPD outcomes in different stages. Several research propositions are presented and indicate that the higher TMT heterogeneity results in a higher degree of team conflict. Furthermore, cognitive conflict positively affects NPD initiation stage, but negative in the implementation stage. From a perspective of cultural differences, managers in Taiwan, compared with those in the United States, tend to sustain organizational cohesion and harmony, emphasize personal relationships, and sidestep direct conflict as much as possible. This cultural characteristic negatively affects NPD initiation, and also wears away the competitive advantages for Taiwanese companies.
  • Keywords
    product development; socio-economic effects; team working; Taiwan; United States; competitive advantages; cultural differences; new product development; organizational cohesion; top management team conflict; Africa; Asia; Cities and towns; Companies; Cultural differences; Decision making; Demography; Environmental economics; Product development; Profitability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management of Engineering & Technology, 2008. PICMET 2008. Portland International Conference on
  • Conference_Location
    Cape Town
  • Print_ISBN
    978-1-890843-17-5
  • Electronic_ISBN
    978-1-890843-18-2
  • Type

    conf

  • DOI
    10.1109/PICMET.2008.4599730
  • Filename
    4599730