Title :
Specialised excitation and wavelet feature extraction in fault diagnosis of analogue electronic circuits
Author :
Chruszczyk, L. ; Rutkowski, J.
Author_Institution :
Silesian University of Technology, POLAND
Abstract :
This article presents design of specialised aperiodic excitation. Purpose is fault diagnosis of analogue electronic circuits. The goal is enhancement of parametric (soft) faults location. Such combination is one of the most difficult diagnosis cases. Further improvement is achieved after utilising wavelet transform as a feature extractor. Obtained results are compared with fault diagnosis by means of the simplest aperiodic function: unit step.
Keywords :
Circuit faults; Circuit testing; Dictionaries; Electronic circuits; Fault diagnosis; Fault location; Feature extraction; Tellurium; Time measurement; Wavelet transforms; Analogue electronics; Fault diagnosis; Fault dictionary; Fault location; Genetic algorithm; Wavelet transform;
Conference_Titel :
Mixed Design of Integrated Circuits and Systems, 2008. MIXDES 2008. 15th International Conference on
Conference_Location :
Poznan, Poland
Print_ISBN :
978-83-922632-7-2
Electronic_ISBN :
978-83-922632-8-9
