• DocumentCode
    475740
  • Title

    Research on Digital Circuit Fault Location Procedure Based on LASAR

  • Author

    Wei, Su ; Shide, Zhang ; Lijun, Xue

  • Author_Institution
    Beijing Union Univ., Beijing
  • Volume
    2
  • fYear
    2008
  • fDate
    3-4 Aug. 2008
  • Firstpage
    322
  • Lastpage
    326
  • Abstract
    This paper describes LASAR V6 (logic automated stimulus response) that is the software for digital test program to generate fault dictionary used as a diagnosis database of fault isolation for a tested circuit based on fault simulation, presents three core files relating to circuit fault diagnosis which is generated by LASAR, i.e. fault dictionary, node truth table and pin connection table, analyses the content of fault dictionary, pin connection table and node truth table, finds the necessary information for fault location, summarizes the procedure of circuit test and fault location. Finally the digital circuit diagnosis system which can locate the fault on the pin of components is designed. With the help of probe, fault location of component pins can be accurately pinpointed.
  • Keywords
    circuit reliability; digital circuits; fault diagnosis; logic simulation; logic testing; LASAR; diagnosis database; digital circuit fault location; digital test program; fault isolation; logic automated stimulus response; node truth table; pin connection table; Automatic testing; Circuit faults; Circuit testing; Dictionaries; Digital circuits; Fault diagnosis; Fault location; Logic circuits; Logic testing; Software testing; LASAR; fault diagnosis; fault dictionary;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computing, Communication, Control, and Management, 2008. CCCM '08. ISECS International Colloquium on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-0-7695-3290-5
  • Type

    conf

  • DOI
    10.1109/CCCM.2008.253
  • Filename
    4609699