• DocumentCode
    476296
  • Title

    A framework of common spatial patterns based on support vector decomposition machine

  • Author

    Yin, Kai ; Wu, Jin ; Zhang, Jia-cai

  • Author_Institution
    Coll. of Inf. Sci. & Technol., Beijing Normal Univ., Beijing
  • Volume
    6
  • fYear
    2008
  • fDate
    12-15 July 2008
  • Firstpage
    3434
  • Lastpage
    3438
  • Abstract
    In the study of brain-computer interfaces (BCI), the techniques of feature extraction and classification play an important role, especially in classifying single-trial electroencephalogram (EEG). In previous research, many researchers have solved these problems in two separate phases: firstly use techniques such as singular value decomposition and common spatial pattern to extract features; then design classification such as linear discriminant analysis or support vector machine. In this paper, we show a framework that combines common spatial patterns (CSP) and support vector machine (SVM) to analyze single-trial EEG/ECoG dataset. We demonstrated experimental results in the data set I of ldquoBCI Competition 2005rdquo analysis with this method which gets a high level of classification accuracy on the test set.
  • Keywords
    electroencephalography; medical signal processing; singular value decomposition; support vector machines; user interfaces; brain-computer interfaces; feature classification; feature extraction; linear discriminant analysis; single-trial electroencephalogram; singular value decomposition; spatial patterns; support vector decomposition machine; Brain computer interfaces; Data mining; Electroencephalography; Feature extraction; Linear discriminant analysis; Pattern analysis; Singular value decomposition; Support vector machine classification; Support vector machines; Testing; BCI; CSP; EEG; SVDM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2008 International Conference on
  • Conference_Location
    Kunming
  • Print_ISBN
    978-1-4244-2095-7
  • Electronic_ISBN
    978-1-4244-2096-4
  • Type

    conf

  • DOI
    10.1109/ICMLC.2008.4620998
  • Filename
    4620998