DocumentCode
476508
Title
Statistical VNA calibration technique using thru and multiple reflect terminations
Author
Wiatr, Wojciech
Author_Institution
Inst. of Electron. Syst., Warsaw Univ. of Technol., Warsaw
fYear
2008
fDate
19-21 May 2008
Firstpage
1
Lastpage
2
Abstract
A novel statistical technique for calibrating vector network analyzer (VNA) with zero-length thru and multiple-reflect terminations is presented. The terminations are assumed to be of the same type, e.g. offset terminations of different lengths with partly unknown characteristics. Their reflection coefficients are modeled over frequency and identified in the calibration together with the VNA error terms. Experiments have verified high accuracy of this new technique.
Keywords
calibration; network analysers; statistical analysis; calibration technique; multiple-reflect terminations; statistical technique; vector network analyzer; zero-length thru terminations; Calibration; Circuits; Frequency; Impedance; Length measurement; Optical reflection; Propagation constant; Time measurement; Transmission line theory; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwaves, Radar and Wireless Communications, 2008. MIKON 2008. 17th International Conference on
Conference_Location
Wroclaw
Print_ISBN
978-83-906662-8-0
Type
conf
Filename
4630151
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