• DocumentCode
    476669
  • Title

    Development of Rasch-based descriptive scale in profiling information professionals’ competency

  • Author

    Aziz, Azrilah Abdul ; Mohamed, Azlinah ; Arshad, Noor Habibah ; Zakaria, Sohaimi ; Ghulman, Hamza Ahmad ; Masodi, Mohd Saidfudin

  • Author_Institution
    Faculty of Information Technology and Quantitative Science, Universiti Teknologi MARA, 40800 Shah Alam, Selangor, MALAYSIA
  • Volume
    1
  • fYear
    2008
  • fDate
    26-28 Aug. 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The development of Rasch measurement model has rapidly expanded from social science, educational fields to other technology and engineering field as well. This study is an attempt to apply Rasch Measurement in the field of technology to assess Information Professionals’ (IP) competency. Bloom’s Taxonomy is used as the framework for assessment whilst utilising Rasch model in constructing the measurement in evaluating the competencies. Assessment only generates raw score and need to be transformed into meaningful measurement values. Rasch model measurement enable tabulation the IP; person and, a given task; the items, on a distribution map (PIDM) on a common scale termed logit. It gives a more accurate estimate of the IP’s achievement on a linear scale of measurement. Comparative analysis against the traditional histogram tabulation and simple mean shows that Rasch measurement was found to give a better exploratory depth in understanding the ability of each IP. Despite the small sample size, the IP were clearly categorized according to the respective workgroup cluster, knowledge and skills. This leads to a new paradigm in assessing competency of IP individuals using Rasch model. A new descriptive scale is developed to classify IP’s by class intervals as measured by Rasch Model.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology, 2008. ITSim 2008. International Symposium on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-2327-9
  • Electronic_ISBN
    978-1-4244-2328-6
  • Type

    conf

  • DOI
    10.1109/ITSIM.2008.4631555
  • Filename
    4631555