DocumentCode
477076
Title
Integrated reliability and prognostics prediction methodology for power electronic modules
Author
Bailey, Christopher ; Lu, Haw-minn ; Yin, C ; Tilford, T
Author_Institution
University of Greenwich, UK
fYear
2008
fDate
25-26 June 2008
Firstpage
1
Lastpage
39
Abstract
The article consists of a Powerpoint presentation on integrated reliability and prognostics prediction methodology for power electronic modules. The areas discussed include: power electronics flagship; design for reliability; IGBT module; design for manufacture; power module components; reliability prediction techniques; failure based reliability; etc.
Keywords
design for manufacture; failure analysis; insulated gate bipolar transistors; power bipolar transistors; semiconductor device reliability; IGBT module; design for manufacture; design-for-reliability; failure based reliability; power electronic modules; power module components; prognostics prediction methodology; reliability prediction techniques;
fLanguage
English
Publisher
iet
Conference_Titel
Aircraft Health Management for New Operational and Enterprise Solutions, 2008 IET Seminar on
Conference_Location
London
ISSN
0537-9989
Print_ISBN
978-0-86341-936-2
Type
conf
Filename
4632488
Link To Document