• DocumentCode
    47763
  • Title

    A Model-Driven Approach for the Failure Data Analysis of Multiple Repairable Systems Without Information on Individual Sequences

  • Author

    Pulcini, Gianpaolo

  • Author_Institution
    Ist. Motori, Naples, Italy
  • Volume
    62
  • Issue
    3
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    700
  • Lastpage
    713
  • Abstract
    This paper proposes a model-driven approach which is able to analyze the failure data of multiple repairable systems when no information on the individual sequences is available, thus overcoming the limitations of the previous models proposed in the literature. The proposed approach can analyze the failure data of systems subject to minimal, imperfect, or worse repairs; and is developed under a general form of the baseline failure intensity. Both failure- and time-truncation are considered, provided that the truncation time is the same for all the systems. Due to its physical interpretation, the proposed approach allows the reliability characteristics of the failure process to be estimated, and it allows the effect of the repairs on the system reliability to be checked via testing procedures. The proposed approach has been applied to a well-known real data set, which inspired the work in this paper, showing its flexibility and great potential.
  • Keywords
    failure analysis; maintenance engineering; reliability theory; baseline failure intensity; failure data analysis; failure process reliability characteristics; failure-truncation; imperfect repair model; minimal repair model; model-driven approach; multiple repairable systems; system reliability; testing procedures; time-truncation; worse repair model; Analytical models; Data models; Maintenance engineering; Maximum likelihood estimation; Predictive models; Random variables; Reliability; Imperfect repair model; Poisson processes; reliability evaluation; repairable systems;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2013.2273040
  • Filename
    6562814