Title :
Copper Strip Surface Defects Inspection Based on SVM-RBF
Author :
Liang, Ruiyu ; Ding, Yanqiong ; Zhang, Xuewu ; Chen, Jiasheng
Author_Institution :
Comput. & Inf. Inst., Hohai Univ., Changzhou
Abstract :
Recently, it becomes more important to ensure the quality of the products as copper strip manufacturing has been highly developed. The most difficult problem in process control and automatic inspection is classification of surface defects, so we develop an improved RBF (radial basis function) neural network classifier based on SVM (support vector machine) to automatically learn complicated defect patterns and use pseudo Zernike moment invariant as the defect feature. The optimal initial parameters of RBF network are gained through SVM, which has resolved the problems in traditional methods, e.g. long learning time, and easily getting into local minimum, etc. Furthermore, a BP learning algorithm is presented to adjust these hidden node parameters as well as the weights of the SVM-RBF. The experimental results show that the method is effective.
Keywords :
copper; metallurgical industries; process control; production engineering computing; radial basis function networks; support vector machines; SVM-RBF; automatic inspection; copper strip surface defects inspection; process control; pseudo Zernike moment; radial basis function neural network classifier; support vector machine; Computer aided manufacturing; Copper; Inspection; Neural networks; Pattern recognition; Process control; Radial basis function networks; Strips; Support vector machine classification; Support vector machines; Pseudo Zernike moments; RBF; SVM; copper strips; defect inspection;
Conference_Titel :
Natural Computation, 2008. ICNC '08. Fourth International Conference on
Conference_Location :
Jinan
Print_ISBN :
978-0-7695-3304-9
DOI :
10.1109/ICNC.2008.271