• DocumentCode
    478079
  • Title

    Copper Strip Surface Defects Inspection Based on SVM-RBF

  • Author

    Liang, Ruiyu ; Ding, Yanqiong ; Zhang, Xuewu ; Chen, Jiasheng

  • Author_Institution
    Comput. & Inf. Inst., Hohai Univ., Changzhou
  • Volume
    2
  • fYear
    2008
  • fDate
    18-20 Oct. 2008
  • Firstpage
    41
  • Lastpage
    45
  • Abstract
    Recently, it becomes more important to ensure the quality of the products as copper strip manufacturing has been highly developed. The most difficult problem in process control and automatic inspection is classification of surface defects, so we develop an improved RBF (radial basis function) neural network classifier based on SVM (support vector machine) to automatically learn complicated defect patterns and use pseudo Zernike moment invariant as the defect feature. The optimal initial parameters of RBF network are gained through SVM, which has resolved the problems in traditional methods, e.g. long learning time, and easily getting into local minimum, etc. Furthermore, a BP learning algorithm is presented to adjust these hidden node parameters as well as the weights of the SVM-RBF. The experimental results show that the method is effective.
  • Keywords
    copper; metallurgical industries; process control; production engineering computing; radial basis function networks; support vector machines; SVM-RBF; automatic inspection; copper strip surface defects inspection; process control; pseudo Zernike moment; radial basis function neural network classifier; support vector machine; Computer aided manufacturing; Copper; Inspection; Neural networks; Pattern recognition; Process control; Radial basis function networks; Strips; Support vector machine classification; Support vector machines; Pseudo Zernike moments; RBF; SVM; copper strips; defect inspection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Natural Computation, 2008. ICNC '08. Fourth International Conference on
  • Conference_Location
    Jinan
  • Print_ISBN
    978-0-7695-3304-9
  • Type

    conf

  • DOI
    10.1109/ICNC.2008.271
  • Filename
    4666953