• DocumentCode
    479505
  • Title

    Development of an electron tunneling force sensor for the use in microassembly

  • Author

    Wang, Lidai ; Mills, James K. ; Cleghorn, William L.

  • Author_Institution
    Dept. of Mech. & Ind. Eng., Univ. of Toronto, Toronto, ON
  • fYear
    2008
  • fDate
    15-15 Oct. 2008
  • Firstpage
    205
  • Lastpage
    208
  • Abstract
    We present the development of an electron tunneling force sensor for use in microassembly and micromanipulation tasks. The force sensor consists of flexible structural members, to which two electrodes are attached, which deflect under the application of grasping forces, and a thermal actuator. A feedback controller is developed to maintain a constant tunneling current across the two electrodes, thereby maintaining constant displacement of the electrodes. Measurement of the voltage applied to the thermal actuator to maintain a constant electrode displacement allows the grasping force to be determined. The design and modeling of the force sensor are addressed. The fabrication of sharp tunnel tips using commercially available MEMS process is investigated. A sharp tunnel tip with width less than 100 nm is achieved using the PolyMUMPs process. The electron tunneling force sensor has extremely high sensitivity, which make it very suitable for micromanipulation tasks.
  • Keywords
    construction components; controllers; feedback; force sensors; grippers; microactuators; microassembling; micromanipulators; microsensors; tunnelling; MEMS; PolyMUMPs process; electron tunneling force sensor; feedback controller; flexible structural members; grasping forces; microassembly; microgripper; micromanipulation; thermal actuator; tunneling current; Actuators; Adaptive control; Electrodes; Electrons; Force measurement; Force sensors; Microassembly; Thermal force; Tunneling; Voltage measurement; Electron tunneling force sensor; PolyMUMPs; microassembly; micromanipulation; sharp tip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems and Nanoelectronics Research Conference, 2008. MNRC 2008. 1st
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    978-1-4244-2920-2
  • Electronic_ISBN
    978-1-4244-2921-9
  • Type

    conf

  • DOI
    10.1109/MNRC.2008.4683414
  • Filename
    4683414