• DocumentCode
    480617
  • Title

    Research of PSO-BP Optimal Algorithm in Material Moisture Measurement

  • Author

    Jiang, Yu ; Liu, Xingpeng ; Xia, Hong ; Teng, Wei ; Bai, Xuewei ; Gao, Xin

  • Author_Institution
    Inf. & Commun. Eng. Coll., Harbin Eng. Univ., Harbin
  • Volume
    2
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    293
  • Lastpage
    297
  • Abstract
    Based on PSO-BP optimal algorithm an evolutionary neural network model is presented to improve the measurement accuracy with microwave resonant. Firstly, the global search ability and rate-displacement model of the PSO algorithm are used to follow the current instance dynamically and modulate its search strategy. And then BP local searching ability which avoids oscillating near the optimal solution or suboptimal solution and converges on the optimal solution speedy is considered. Experiments show that the PSO-BP optimal algorithm has the merits of high prediction precision, rapid convergence, global superiority and accuracy for optimization. It improves the measurement precision with the mean squared error 0.0118, the mean absolute error 0.0619, the mean relative error 0.1176 and the certain coefficient 0.9956 between the predicted moisture content and the real value.
  • Keywords
    backpropagation; materials handling; mean square error methods; moisture measurement; neural nets; particle swarm optimisation; production engineering computing; PSO-BP optimal algorithm; evolutionary neural network model; material moisture measurement; mean absolute error; mean relative error; mean squared error; microwave resonant; Coaxial components; Density measurement; Educational institutions; Linear regression; Microwave sensors; Microwave theory and techniques; Moisture measurement; Power engineering and energy; Resonance; Water storage; Evolutionary Neural Network Model; Microwave Resonant; Moisture; PSO-BP Optimal Algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3497-8
  • Type

    conf

  • DOI
    10.1109/IITA.2008.384
  • Filename
    4739774