• DocumentCode
    483345
  • Title

    HBM ESD failures caused by a parasitic pre-discharge current spike

  • Author

    Etherton, Melanie ; Axelrod, Victor ; Meuse, Tom ; Miller, James W. ; Marom, Haim

  • Author_Institution
    Freescale Semicond. Inc., Austin, TX, USA
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    30
  • Lastpage
    39
  • Abstract
    A new tester-induced HBM current waveform anomaly was discovered as a result of efforts to understand the cause of low level HBM failures seen on 65 nm CMOS products. The anomaly, which consists of a current spike occurring just prior to the actual HBM pulse, was found to be caused by contact misalignment in the tester¿s discharge relay.
  • Keywords
    integrated circuit testing; CMOS products; HBM ESD failures; contact misalignment; discharge relay; parasitic pre-discharge current spike; tester-induced HBM current waveform anomaly; Biological system modeling; Circuit testing; Clamps; Electrostatic discharge; MOSFET circuits; Protection; Qualifications; Rails; Stress; Trigger circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    978-1-58537-146-4
  • Electronic_ISBN
    978-1-58537-147-1
  • Type

    conf

  • Filename
    4772112