• DocumentCode
    484126
  • Title

    Texture Analysis and its Application for Single-Band SAR Thematic Information Extraction

  • Author

    De-yong, Hu ; Xiao-juan, Li ; Wen-ji, Zhao ; Hui-li, Gong

  • Author_Institution
    Key Lab. of 3D Inf. Acquisition & Applic., Minist. of Educ.
  • Volume
    2
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    In this paper single-band and single-polarization Radarsat-1 SAR image is used to evaluate image classification with textural analysis. Firstly, the statistic information of sample were analyzed using semivariogram to determine the optimum parameters for textural extraction; Then four textures such as Homogeneity, Mean, Angle Second Moment and Entropy had been calculated based on GLCM, and the image data were processed using Support Vector Machine classification. The results show that the water and settlement areas are extracted accurately with accuracy 99.34% and 82.54%, and the SVM method has better extension ability for SAR image classification; Assisting with textural information, the image classification based on SVM has a obvious enhancement to original SAR, especially for some complex objects such as settlement areas(about increasing accuracy 18%).
  • Keywords
    feature extraction; image classification; image texture; remote sensing by radar; support vector machines; synthetic aperture radar; Angle Second Moment texture; Entropy texture; GLCM; Homogeneity texture; Mean texture; Support Vector Machine classification; image classification; semivariogram; settlement areas; single-band SAR thematic information extraction; single-polarization Radarsat-1 SAR image; water areas; Brightness; Data mining; Extraterrestrial measurements; Image analysis; Image classification; Image texture analysis; Information analysis; Pixel; Support vector machine classification; Support vector machines; GLCM; SAR; SVM; semivariogram;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779149
  • Filename
    4779149