DocumentCode
484347
Title
Comparisons between in Situ Anisotropic Reflectance Measurements and Simulations for Vegetation Canopies: Validation and Sensitivity Analysis
Author
Cheng, Yen-Ben ; Corp, Lawrence A. ; Middleton, Elizabeth M. ; Huemmrich, Karl F. ; Zhang, Qingyuan ; Campbell, Petya K E ; Parker, Geoffrey
Author_Institution
Nat. Aeronaut. & Space Adm., Goddard Space Flight Center, Greenbelt, MD
Volume
3
fYear
2008
fDate
7-11 July 2008
Abstract
In situ directional reflectance observations were taken on trees of three species and were used to validate the Four-Scale Linear Model for AnIsotropic Reflectance (FLAIR). FLAIR-simulated spectra were satisfactory in general, especially for the shaded and shaded/sunlit mixed portions of the canopy but were species dependent. Good agreements with field observations were found when utilizing these simulations to derive band ratio indexes, Normalized Difference Vegetation Index (NDVI) and Photochemical Reflectance Index (PRI). Sensitivity analysis were performed to investigate the importance of three canopy biophysical parameters, and the leaf to shoot ratio showed the most impact on simulation results. The results in this study showed the potential to simulate directional reflectances with FLAIR on canopies with complicated structure.
Keywords
atmospheric boundary layer; atmospheric radiation; remote sensing; vegetation; FLAIR; FLAIR-simulation; Four- Scale Linear Model for Anisotropic Reflectance; NDVI; Normalized Difference Vegetation Index; PRI; Photochemical Reflectance Index; anisotropic reflectance measurement; canopy biophysical parameter; leaf-shoot ratio; sensitivity analysis; tree species; vegetation canopy simulation; Analytical models; Anisotropic magnetoresistance; Geoscience; Lighting; Photochemistry; Reflectivity; Sea measurements; Sensitivity analysis; Space technology; Vegetation mapping; FLAIR; NDVI; Photochemical Reflectance Index (PRI); four-scale;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location
Boston, MA
Print_ISBN
978-1-4244-2807-6
Electronic_ISBN
978-1-4244-2808-3
Type
conf
DOI
10.1109/IGARSS.2008.4779467
Filename
4779467
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