DocumentCode
484515
Title
Improved Remotely-Sensed Estimates of Crop Residue Cover by Incorporating Soils Information
Author
Serbin, Guy ; Daughtry, C.S.T. ; Hunt, E. Raymond, Jr. ; McCarty, Gregory W. ; Doraiswamy, Paul C. ; Brown, David J.
Author_Institution
USDA-ARS Hydrol. & Remote Sensing Lab., Beltsville, MD
Volume
4
fYear
2008
fDate
7-11 July 2008
Abstract
Remote sensing allows for the rapid determination of crop residue cover. The Cellulose Absorption Index (CAI) has been shown to more accurately estimate residue cover and non-photosynthetic vegetation than other indices. CAI is useful as values are linear areal mixtures of soil and residue spectral properties. Our research shows that spatial soil property data can be used for calibration to improve residue cover estimates. Furthermore, residue cover estimations are affected by rainfall and live green vegetation, and these need to be accounted for in analyses. This work supports the concept that future remote sensing platforms should include CAI bands to allow for better estimation of residue cover.
Keywords
calibration; crops; erosion; evaporation; geochemistry; infrared spectroscopy; radiometry; rain; remote sensing; soil; CAI; Cellulose Absorption Index; Earth Surface Processes Team; SOC content; X-ray diffractometry; XRD; airborne imagery; calibration; crop residue cover determination; evaporation; green vegetation; image analysis; nonphotosynthetic vegetation; rainfall; remote sensing; residue cover estimation; residue spectral property; shortwave infrared band; soil erosion; soil mineralogy; soil organic carbon; soil spectral property; spectroradiometer; wavelength 2.1 mum; Computer aided instruction; Crops; Electromagnetic wave absorption; Laboratories; Reflectivity; Remote monitoring; Remote sensing; Soil measurements; Testing; Vegetation mapping; Agriculture; infrared spectroscopy; remote sensing; soil measurements; vegetation mapping;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location
Boston, MA
Print_ISBN
978-1-4244-2807-6
Electronic_ISBN
978-1-4244-2808-3
Type
conf
DOI
10.1109/IGARSS.2008.4779709
Filename
4779709
Link To Document