DocumentCode
484692
Title
Interpretation of Perturbative Solution for the Scattering From Layered Structure With Rough Interfaces
Author
Imperatore, Pasquale ; Iodice, Antonio ; Riccio, Daniele
Author_Institution
Dipt. di Ing. Elettron. e delle Telecomun., Univ. di Napoli "Federico II", Naples
Volume
4
fYear
2008
fDate
7-11 July 2008
Abstract
In this paper the focus is on the intrinsic significance of the first-order perturbative scattering solution for the scattering from layered structures with an arbitrary number of rough interfaces. An exact analytic decomposition of the solution in terms of local interactions is carried out. Consequently, the suitably expanded solution can be expressed as an optical geometric series, where each term of the series is susceptible of a direct physical interpretation. Therefore, the obtained interpretation enables the global scattering phenomenon involved to be visualized as a superposition of local interactions, emphasizing the role of the interference effects in the structure as well. The interpretation opens the way to new techniques for solving the inverse problem, for designing SAR processing algorithms, and for modelling the time-domain response of complex layered structures.
Keywords
electromagnetic wave interference; electromagnetic wave scattering; inhomogeneous media; remote sensing; series (mathematics); SAR processing algorithm design; complex layered structures; exact analytic decomposition; first order perturbative scattering solution; global scattering phenomenon; interference effects; inverse problem; local interaction superposition; local interactions; optical geometric series; rough interfaces; time domain response modelling; Algorithm design and analysis; Electromagnetic scattering; Geometrical optics; Interference; Inverse problems; Light scattering; Optical scattering; Physics; Process design; Visualization; Layered media; Perturbation Methods; Sub-Surface Sensing; Surface & Volume Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location
Boston, MA
Print_ISBN
978-1-4244-2807-6
Electronic_ISBN
978-1-4244-2808-3
Type
conf
DOI
10.1109/IGARSS.2008.4779929
Filename
4779929
Link To Document