• DocumentCode
    48502
  • Title

    Investigation of 14 MeV Neutron Capabilities for SEU Hardness Evaluation

  • Author

    Miller, Florent ; Weulersse, C. ; Carriere, T. ; Guibbaud, Nicolas ; Morand, S. ; Gaillard, R.

  • Author_Institution
    EADS France, Suresnes, France
  • Volume
    60
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    2789
  • Lastpage
    2796
  • Abstract
    This work investigates the capabilities of 14 MeV neutron tests to characterize the Single Event Upset sensitivity of digital devices. Analysis of secondary ions, experimental tests and extrapolation thanks to nuclear databases are performed to support the work.
  • Keywords
    hardness testing; neutron sources; SEU hardness evaluation; digital devices; electron volt energy 14 MeV; extrapolation; neutron tests; nuclear databases; single event upset sensitivity; Generators; Ions; Neutrons; Radiation effects; Random access memory; Sensitivity; Silicon; 14 MeV neutrons; neutron-induced Single Event Upset (SEU);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2241078
  • Filename
    6457429
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=48502