DocumentCode
48693
Title
Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits
Author
Sayil, Selahattin ; Yeddula, Sumanth R. ; Juyu Wang
Author_Institution
Dept. of Electr. Eng., Lamar Univ., Beaumont, TX, USA
Volume
30
Issue
6
fYear
2013
fDate
Dec. 2013
Firstpage
89
Lastpage
97
Abstract
There are various sources of single event transient (SET) errors for combinatorial logic circuits. This article discusses effects of various sources of SET errors and presents a comparative analysis in different technology nodes.
Keywords
CMOS integrated circuits; combinational circuits; radiation hardening (electronics); SET errors; combinatorial logic circuits; nanoscale CMOS circuits; single event transient errors; single-event coupling soft errors; CMOS integrated circuits; Coupling circuits; Error correction; Integrated circuit reliability; Noise measurement; Particle measurements; Reliability; Single event transients; Coupling Noise; Single Event Crosstalk; Soft Error Reliability;
fLanguage
English
Journal_Title
Design & Test, IEEE
Publisher
ieee
ISSN
2168-2356
Type
jour
DOI
10.1109/MDAT.2013.2261432
Filename
6514059
Link To Document