• DocumentCode
    48942
  • Title

    Recrystallization and {\\rm Ag}_{3}{\\rm Sn} Particle Redistribution During Thermomechanical Treatment of Bulk Sn–Ag–Cu Solder Alloys

  • Author

    Sahaym, Uttara ; Talebanpour, B. ; Seekins, Sean ; Dutta, I. ; Kumar, Pranaw ; Borgesen, P.

  • Author_Institution
    Sch. of Mech. & Mater. Eng., Washington State Univ., Pullman, WA, USA
  • Volume
    3
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    1868
  • Lastpage
    1875
  • Abstract
    Sn-Ag-Cu (SAC) solders are susceptible to appreciable microstructural coarsening during storage or service. This results in evolution of joint properties over time and thereby influences the long-term reliability of microelectronic packages. Accurate reliability prediction of SAC solders requires prediction of microstructural evolution during service. Microstructure evolution in two SAC solder alloys, such as, Sn-3.0Ag-0.5Cu (SAC 305) and Sn-1.0Ag-0.5 Cu (SAC 105), under different thermomechanical excursions, including isothermal aging at 150°C and thermomechanical cycling (TMC) was studied. In general, between 200 and 600 cycles during TMC, recrystallization of the Sn matrix was observed, along with redistribution of Ag3Sn particles because of dissolution and reprecipitation. These latter effects have not been reported before. It was also observed that the Sn grains recrystallized near precipitate clusters in eutectic channels during extended isothermal aging. The relative orientation of Sn grains in proeutectic colonies did not change during isothermal aging.
  • Keywords
    ageing; copper alloys; crystal microstructure; dissolving; precipitation; recrystallisation; reliability; silver alloys; solders; tin alloys; Sn-Ag-Cu; bulk solder alloys; dissolution; eutectic channels; isothermal aging; long-term reliability; microelectronic packages; microstructural coarsening; microstructural evolution; particle redistribution; precipitate clusters; proeutectic colonies; recrystallization; reprecipitation; temperature 150 degC; thermomechanical cycling; thermomechanical excursions; thermomechanical treatment; Aging; Grain size; Isothermal processes; Microstructure; Strain; Tin; Electron backscatter diffraction (EBSD); lead-free solders; recrystallization;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2272543
  • Filename
    6563140