DocumentCode :
48942
Title :
Recrystallization and {\\rm Ag}_{3}{\\rm Sn} Particle Redistribution During Thermomechanical Treatment of Bulk Sn–Ag–Cu Solder Alloys
Author :
Sahaym, Uttara ; Talebanpour, B. ; Seekins, Sean ; Dutta, I. ; Kumar, Pranaw ; Borgesen, P.
Author_Institution :
Sch. of Mech. & Mater. Eng., Washington State Univ., Pullman, WA, USA
Volume :
3
Issue :
11
fYear :
2013
fDate :
Nov. 2013
Firstpage :
1868
Lastpage :
1875
Abstract :
Sn-Ag-Cu (SAC) solders are susceptible to appreciable microstructural coarsening during storage or service. This results in evolution of joint properties over time and thereby influences the long-term reliability of microelectronic packages. Accurate reliability prediction of SAC solders requires prediction of microstructural evolution during service. Microstructure evolution in two SAC solder alloys, such as, Sn-3.0Ag-0.5Cu (SAC 305) and Sn-1.0Ag-0.5 Cu (SAC 105), under different thermomechanical excursions, including isothermal aging at 150°C and thermomechanical cycling (TMC) was studied. In general, between 200 and 600 cycles during TMC, recrystallization of the Sn matrix was observed, along with redistribution of Ag3Sn particles because of dissolution and reprecipitation. These latter effects have not been reported before. It was also observed that the Sn grains recrystallized near precipitate clusters in eutectic channels during extended isothermal aging. The relative orientation of Sn grains in proeutectic colonies did not change during isothermal aging.
Keywords :
ageing; copper alloys; crystal microstructure; dissolving; precipitation; recrystallisation; reliability; silver alloys; solders; tin alloys; Sn-Ag-Cu; bulk solder alloys; dissolution; eutectic channels; isothermal aging; long-term reliability; microelectronic packages; microstructural coarsening; microstructural evolution; particle redistribution; precipitate clusters; proeutectic colonies; recrystallization; reprecipitation; temperature 150 degC; thermomechanical cycling; thermomechanical excursions; thermomechanical treatment; Aging; Grain size; Isothermal processes; Microstructure; Strain; Tin; Electron backscatter diffraction (EBSD); lead-free solders; recrystallization;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2013.2272543
Filename :
6563140
Link To Document :
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