Title :
Performance Analysis of Multiple Chips Per Symbol M-ary FSK in Fast, Slow and Partially Correlated Rayleigh Fading
Author_Institution :
RAYTHEON COMPANY, MARLBOROUGH, MA 01752
Abstract :
Error rate performance analysis is presented in this paper for the multiple chips per symbol M-ary FSK in the fast, slow and partially correlated Rayleigh fading environments. Exact error rate expressions are given for the three fading situations considered. Numerical results are provided for the 8-FSK waveform. Error performance with forward error control coding is also presented to show the improvement over the uncoded cases. These results have direct application to the design of ionospheric communication systems.
Keywords :
Covariance matrix; Decorrelation; Error analysis; Error correction; Fading; Frequency shift keying; Genetic expression; Performance analysis; Random variables; Rayleigh channels;
Conference_Titel :
Military Communications Conference - Crisis Communications: The Promise and Reality, 1987. MILCOM 1987. IEEE
Conference_Location :
Washington, DC, USA
DOI :
10.1109/MILCOM.1987.4795295
