• DocumentCode
    49260
  • Title

    Compact algorithmic time-to-digital converter

  • Author

    Shuo Li ; Salthouse, Christopher D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., UMASS, Amherst, MA, USA
  • Volume
    51
  • Issue
    3
  • fYear
    2015
  • fDate
    2 5 2015
  • Firstpage
    213
  • Lastpage
    215
  • Abstract
    Time-to-digital converters (TDCs) are an important circuit block in time-of-flight sensors, fluorescence lifetime sensors, and self-calibrating digital circuits. Fine-resolution TDCs are usually built with chains of delay elements, but this architecture requires large area, conversion time, and power consumption. A novel compact TDC architecture based on the cyclic comparison algorithm is presented, which implemented and tested in the TSMC, 0.35 μm process within a 200 × 200 μm area is demonstrated that the proposed TDC achieves a conversion rate of 10 ns/bit and sub-picosecond resolution. The measured power is 0.7 mW, taking 100 ns for each bit.
  • Keywords
    calibration; optical sensors; time-digital conversion; TSMC process; compact TDC architecture; compact algorithmic time-to-digital converter; cyclic comparison algorithm; delay element chain; fine-resolution TDC; fluorescence lifetime usually sensor; power 0.7 mW; power consumption; self-calibrating digital circuit; size 0.35 mum; time 100 ns; time-of-flight sensor;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.3998
  • Filename
    7029776