DocumentCode
49393
Title
Improved Quantum Efficiency in Semipolar
InGaN/GaN Quantum Wells Grown on GaN Prepared by Lateral Epitaxial Overgrowth
Author
Lihong Zhu ; Fanming Zeng ; Wei Liu ; Zhechuan Feng ; Baolin Liu ; Yijun Lu ; Yulin Gao ; Zhong Chen
Author_Institution
Fujian Eng. Res. Center for Solid-State Lighting, Xiamen Univ., Xiamen, China
Volume
60
Issue
11
fYear
2013
fDate
Nov. 2013
Firstpage
3753
Lastpage
3759
Abstract
We investigated the comparative structural and optical properties of semipolar InGaN/GaN multiple quantum wells (MQWs) grown on the (1̅101) facet GaN/sapphire substrate by metal-organic chemical vapor deposition using lateral epitaxial overgrowth. The scanning electron microscopy (SEM), photoluminescence (PL), and temperature-varying time-resolved photoluminescence measurement were performed to investigate the structure and optical properties. The cross-sectional SEM image shows that the stripe triangular structure of the QW with semipolar (1̅101) planes is obtained as sidewall facets with the mask stripes aligned along the GaN α-axis. The structural and optical advantages of semipolar orientations were confirmed by a modurate shift of the PL peak energy, higher internal quantum efficiency, and lower radiative recombination lifetime than the MQWs on (0001) GaN grown by conventional methods. The results were obtained because of the reduced polarization fields in semipolar InGaN/GaN MQWs comparing with that in polar (0001) MQWs.
Keywords
III-V semiconductors; MOCVD; gallium compounds; indium compounds; photoluminescence; scanning electron microscopy; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum wells; time resolved spectra; vapour phase epitaxial growth; wide band gap semiconductors; (11̅01) facet GaN/sapphire substrate; GaN-Al2O3; InGaN-GaN; SEM; lateral epitaxial overgrowth; metal-organic chemical vapor deposition; optical properties; quantum efficiency; radiative recombination lifetime; scanning electron microscopy; semipolar (11̅01) InGaN/GaN multiple quantum wells; stripe triangular structure; structural properties; temperature-varying time-resolved photoluminescence; Gallium nitride; Light emitting diodes; Quantum well devices; Radiative recombination; Scanning electron microscopy; Substrates; Temperature dependence; InGaN/GaN multiple quantum wells; lateral epitaxial overgrowth; photoluminescence; semipolar;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2282233
Filename
6631478
Link To Document