• DocumentCode
    49419
  • Title

    Real-Time Processing of Multifrequency Eddy Currents Testing Signals: Design, Implementation, and Evaluation

  • Author

    Rosado, Luis S. ; Ramos, Pedro M. ; Piedade, Moises

  • Author_Institution
    Inst. de Telecomun., Lisbon, Portugal
  • Volume
    63
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1262
  • Lastpage
    1271
  • Abstract
    The design, implementation, and evaluation of a real-time digital signal processing architecture to generate and process multifrequency signals for eddy currents testing is described in this paper. This architecture is implemented on a dedicated instrument whose processing core is a field-programmable gate array. Stimulus generation is achieved using direct digital synthesis with some important improvements to reduce spurious frequency components. An in-phase and in-quadrature demodulation scheme is implemented to estimate the real and imaginary parts of the probe output signal. A cascaded integrator comb decimator is used to lower the sampling frequency and then allow narrowband filtering with low resources. The proposed architecture is able to generate and process the stimulus and input data at 125 MSamples/s and to estimate the input data components at 1.25 MSamples/s rate for eddy-currents with multiple simultaneous testing frequencies between 2.5 kHz and 10 MHz. Experimental validation is performed using a set of synthetic defects and two stimulus with different spectral composition.
  • Keywords
    demodulation; eddy current testing; field programmable gate arrays; signal processing; cascaded integrator comb decimator; direct digital synthesis; field programmable gate array; frequency 2.5 kHz to 10 MHz; in-phase demodulation scheme; in-quadrature demodulation scheme; multifrequency eddy currents testing signals; narrowband filtering; real-time processing; sampling frequency; Demodulation; Digital signal processing; Eddy currents; Interpolation; Probes; Table lookup; Testing; Digital signal processing (DSP); eddy currents testing; field-programmable gate array (FPGA); multifrequency demodulation; multifrequency stimulus;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2283633
  • Filename
    6631480