• DocumentCode
    494393
  • Title

    The Surface Flaw Detection by Gabor Wavelet

  • Author

    Liu, XueMei ; Sun, ZhiJian

  • Author_Institution
    Adm. of State - Owned Assets, Qingdao Technol. Univ., Qingdao
  • Volume
    1
  • fYear
    2008
  • fDate
    21-22 Dec. 2008
  • Firstpage
    487
  • Lastpage
    490
  • Abstract
    This paper researches the shell body flaw product line quality detecting system which requires non-contact measurement, gives its characteristic information, displays in computer and automatic alarm functions. This system realizes the quantitative analysis for the physical features such as length and location by trailing and extracting, line draft joining and other methods to flaw image of post pretreatment. It is proved that this method using Gabor wavelet transform is better than traditional methods such as through smoothing, sharp and so on in edge extracting. The reason is that image noise and edge is high frequency signal and can´t be differed by frequency band methods. As regards shell body, flaw and edge signal is high frequency weight and noise is low frequency weight. Therefore, the author reduces shell noise, extracts edge and flaw using wavelet transform according to the above characteristic.
  • Keywords
    Gabor filters; edge detection; flaw detection; shell casting; wavelet transforms; Gabor wavelet transform; automatic alarm function; computer alarm function; edge signal extraction; image noise; non contact measurement; shell body flaw product line quality detection system; surface flaw detection; Fault diagnosis; Frequency; Gabor filters; Image analysis; Image edge detection; Low-frequency noise; Surface waves; Wavelet coefficients; Wavelet domain; Wavelet transforms; Gabor wavelet; domain correlation; edge detection; identification fault; non-contact measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Education Technology and Training, 2008. and 2008 International Workshop on Geoscience and Remote Sensing. ETT and GRS 2008. International Workshop on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3563-0
  • Type

    conf

  • DOI
    10.1109/ETTandGRS.2008.236
  • Filename
    5070202