• DocumentCode
    495201
  • Title

    A Comparative Analysis of Neuro-fuzzy and Grammatical Evolution Models for Simulating Field-Effect Transistors

  • Author

    Kaur, Devinder ; Baumgartner, Dustin

  • Author_Institution
    Univ. of Toledo, Toledo, OH, USA
  • Volume
    5
  • fYear
    2009
  • fDate
    March 31 2009-April 2 2009
  • Firstpage
    179
  • Lastpage
    183
  • Abstract
    In this paper we have developed fuzzy inference system models for a field-effect transistor. The hope is to see if such techniques can be used for inventing future semiconductor based devices. Three modeling techniques have been used. Neuro fuzzy based on grid partitioning and neuro fuzzy based on cluster partitioning create Sugeno fuzzy inference systems, which are trained with a neural network back propagation method. The third modeling technique is based on grammatical evolution, where a grammar template in the form of rules is evolved using genetic algorithms based evolutionary techniques. This grammar template is based on the Mamdani fuzzy inference system. Experimental results indicate that all models produce acceptable levels of performance, some even have an error rate that is nearly negligible.
  • Keywords
    MOSFET; electronic design automation; fuzzy neural nets; fuzzy reasoning; genetic algorithms; grammars; semiconductor device models; Mamdani fuzzy inference system; Sugeno fuzzy inference systems; cluster partitioning; comparative analysis; evolutionary techniques; field-effect transistors simulation; fuzzy inference system models; genetic algorithms; grammatical evolution models; neural network backpropagation method; neuro-fuzzy models; Analytical models; Bioinformatics; Electrodes; FETs; Fuzzy neural networks; Fuzzy systems; Genomics; MOSFET circuits; Production; Threshold voltage; Field Effect Transistor Modeling; Grammatical Evolution; Neuro Fuzzy Inference System;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Engineering, 2009 WRI World Congress on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    978-0-7695-3507-4
  • Type

    conf

  • DOI
    10.1109/CSIE.2009.720
  • Filename
    5170521