• DocumentCode
    495338
  • Title

    A Detection Method for Effective Silver Electrode Area of High Voltage Ceramic Capacitor Using Sobel-Zernike Moment Operator

  • Author

    Qin, Guang-Xu ; Wang, Jian ; Chen, Liang ; Lv, Qiang ; Li, Xun-bo

  • Author_Institution
    Coll. of Mechanic & Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    6
  • fYear
    2009
  • fDate
    March 31 2009-April 2 2009
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    The production precision of high voltage ceramic capacitor (HVCC) is mainly affected by material and manufacturing process. The conventional quality control process is performed by human experts and sample testing, which is inefficient and error prone. In recent years, many automatic inspection equipments have been developed and many research works have been published. However, the volume manufacturing industry like capacitor still demands a faster and more reliable inspection method. In this paper, we define the silver electrode effective area of HVCC and analyze its degree of influence. The paper proposes a method which uses Sobel-Zernike moment operator to detect capacitance error caused by ineffective area of HVCC electrodes. In our experiments, the proposed method is proved to be very effective. The detecting error rate is less than 1.7%. Furthermore, the inspection method speeds up the testing process 9.9 times as well as increases the yield rate considerably.
  • Keywords
    ceramic capacitors; error detection; inspection; semiconductor device manufacture; Sobel-Zernike moment operator; automatic inspection equipments; capacitance error detection; detection method; effective silver electrode area; high voltage ceramic capacitor; inspection method; quality control process; Capacitors; Ceramics; Electrodes; Inspection; Manufacturing processes; Production; Quality control; Silver; Testing; Voltage; Sobel-Zernike moment operator; ceramic capacitor; effective silver electrode area; image detection method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Engineering, 2009 WRI World Congress on
  • Conference_Location
    Los Angeles, CA
  • Print_ISBN
    978-0-7695-3507-4
  • Type

    conf

  • DOI
    10.1109/CSIE.2009.371
  • Filename
    5170727