• DocumentCode
    497963
  • Title

    Ferroelectric(Fe)-NAND flash memory with non-volatile page buffer for data center application enterprise Solid-State Drives (SSD)

  • Author

    Hatanaka, Teruyoshi ; Yajima, Ryoji ; Horiuchi, Takeshi ; Wang, Shouyu ; Zhang, Xizhen ; Takahashi, Mitsue ; Sakai, Shigeki ; Takeuchi, Ken

  • Author_Institution
    Dept. of Electrical Engineering and Information Systems, University of Tokyo, Japan
  • fYear
    2009
  • fDate
    16-18 June 2009
  • Firstpage
    78
  • Lastpage
    79
  • Abstract
    A ferroelectric(Fe)-NAND flash memory with a non-volatile (NV) page buffer is proposed. The data fragmentation in a random write is removed by introducing a batch write algorithm. As a result, the SSD performance can double. The NV-page buffer realizes a power outage immune highly reliable operation. With a low program/erase voltage, 6V and a high endurance, 100Million cycles, the proposed Fe-NAND is most suitable for a highly reliable high-speed low power data center application enterprise SSD.
  • Keywords
    Buffer storage; Degradation; Energy consumption; Ferroelectric materials; Flash memory; Latches; MOS devices; Nonvolatile memory; Solid state circuits; Voltage; Flash memory; NAND; SSD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2009 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    978-1-4244-3307-0
  • Electronic_ISBN
    978-4-86348-001-8
  • Type

    conf

  • Filename
    5205310