DocumentCode
499288
Title
Modeling asymmetric reflectance in semicontinuous metal films using generalized Ohm´s Law
Author
Kuhta, Nicholas A. ; Chen, A. ; Hasegawa, K. ; Deutsch, Miriam ; Podolskiy, Viktor A.
Author_Institution
Dept. of Phys., Oregon State Univ., Corvallis, OR, USA
fYear
2009
fDate
2-4 June 2009
Firstpage
1
Lastpage
2
Abstract
Generalized Ohm´s Law is used to model the phenomenon of broadband asymmetric reflectance recently observed in semicontinuous metal-dielectric films in the proximity of the percolation threshold. Qualitative agreement with experiment is achieved.
Keywords
dielectric materials; optical films; percolation; reflectivity; broadband asymmetric reflectance; generalized Ohm´s Law; percolation threshold; qualitative agreement; semicontinuous metal films; semicontinuous metal-dielectric films; Conductive films; Glass; Magnetic films; Metal-insulator structures; Optical design; Optical films; Optical filters; Optical reflection; Physics; Reflectivity; 050.2065 Effective Medium Theory; 160.2710 Inhomogeneous Optical Media; 310.0310 Thin Films;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-869-8
Electronic_ISBN
978-1-55752-869-8
Type
conf
Filename
5224367
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