• DocumentCode
    499830
  • Title

    Polarization-ratio reflectance for determining optical constants using laser high-order harmonics

  • Author

    Brimhall, Nicole ; Heilmann, Nathan ; Peatross, Justin

  • Author_Institution
    Dept. of Phys. & Astron., Brigham Young Univ., Provo, UT, USA
  • fYear
    2009
  • fDate
    2-4 June 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We describe a method for deriving optical constants in the extreme ultraviolet from the measured ratio of p- to s-polarized reflectance curves (as a function of angle). These measurements use laser-generated high-order harmonics, which have the advantage of easily rotatable linear polarization. We show that this ratio technique markedly reduces sensitivity to possible systematic brightness and alignment drifts of the harmonic signal during measurement. We also demonstrate that optical constants can be extracted from ratio reflectance measurements as well as they can from absolute reflectance measurements.
  • Keywords
    laser beams; light polarisation; measurement by laser beam; optical constants; optical variables measurement; reflectometry; harmonic signal; laser high-order harmonics; optical constant determination; polarization-ratio reflectance measurement; rotatable linear polarization; Extraterrestrial measurements; Nonlinear optics; Optical films; Optical polarization; Optical refraction; Optical saturation; Optical sensors; Reflectivity; Ultraviolet sources; Wavelength measurement; (160.4760) Optical properties; (340.7480) X-rays, soft x-rays, extreme ultraviolet (EUV);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-869-8
  • Electronic_ISBN
    978-1-55752-869-8
  • Type

    conf

  • Filename
    5225191