DocumentCode
500776
Title
Spare-cell-aware multilevel analytical placement
Author
Jiang, Zhe-Wei ; Hsu, Meng-Kai ; Chang, Yao-Wen ; Chao, Kai-Yuan
Author_Institution
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2009
fDate
26-31 July 2009
Firstpage
430
Lastpage
435
Abstract
Post-silicon validation has recently drawn designers´ attention due to its increasing impacts on the VLSI design cycle and cost. One key feature of the post-silicon validation is the use of spare cells. In the literature, most existing works focus on developing new delicate spare cell structures. On the other hand, the placement of spare cells has a crucial impact on the design cycle and cost of the post-silicon debugging; however, there exists not much work on this placement problem. In this paper, we propose the first spare-cell-aware analytical placement framework which predicts the spare cell requirement and considers spare cell insertion during global placement. We also propose a multilevel spare cell insertion technique which provides a more efficient spare cell planning and a better control of quality impact due to spare cell insertion. To guide the selection of available spare cell positions during insertion, we propose a mixed-integer-linear-programming formulation to determine the optimal spare cell positions. Experimental results show that our algorithm can averagely achieve 17-33% and 1.77-2.61X better quality of spare cell insertion than that of the existing spare cell insertion algorithms, UniSpare and PostSpare , on the tested real designs with 1-5% spare cell insertion rates.
Keywords
VLSI; integer programming; integrated circuit design; linear programming; monolithic integrated circuits; PostSpare; UniSpare; VLSI design cycle; mixed integer linear programming formulation; multilevel spare cell insertion technique; post-silicon debugging; post-silicon validation; spare cell planning; spare cell requirement; spare-cell-aware multilevel analytical placement; Algorithm design and analysis; Chaos; Computer errors; Costs; Debugging; Design engineering; Manufacturing; Permission; Physics computing; Very large scale integration; Physical Design; Placement; Spare Cells;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-6055-8497-3
Type
conf
Filename
5227030
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